The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2004

Filed:

Sep. 25, 2002
Applicant:
Inventors:

Herbert Pairitsch, Klagenfurt, AT;

Frank Pfirsch, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/974 ;
U.S. Cl.
CPC ...
H01L 2/974 ;
Abstract

A semiconductor component having a first main terminal, a second main terminal, a gate terminal for controlling the current between the main terminals is provided. A first diode device can be switched between the first main terminal and the gate terminal. The first diode device has a first breakdown voltage such that the first diode device short-circuits the first main terminal with the gate terminal, thereby switching on the semiconductor component, when the voltage that drops off over the first diode device exceeds a certain predetermined value. The first diode device is connected to the control gate in an integrated manner and has an external contacting area for connecting to the first main terminal.


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Pairitsch, Herbert. (2004). Semiconductor component and corresponding test method (U.S. Patent No. 6762440). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6762440

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