The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2004

Filed:

Feb. 13, 2003
Applicant:
Inventor:

John C. Yundt-Pacheco, Fairview, TX (US);

Assignee:

Xyletech Systems, Inc., Plano, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/530 ; G01N 3/700 ;
U.S. Cl.
CPC ...
G06F 1/530 ; G01N 3/700 ;
Abstract

A method for evaluating the performance of an instrument, particularly a hematology analyzer, by comparing its operating data with data compiled from a group of like instruments is provided. The method contemplates collecting historical data which is deposited in a central database where it may be retrieved by any participating laboratory. The participating laboratory performs an analysis and then accesses the database to retrieve data obtained from comparable instruments performing like analyses. The comparative analysis is then conducted from which a determination may be made with regard to a particular instrument.


Find Patent Forward Citations

Yundt-Pacheco, John. (2004). Method of evaluating performance of a hematology analyzer (U.S. Patent No. 6760683). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6760683

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…