The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2004

Filed:

Nov. 21, 2000
Applicant:
Inventors:

Yoram Elichai, Lehavim, IL;

Yosef Yomdin, Rehovot, IL;

Assignee:

Vimatix (BVI) Ltd., Tortola, VG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 ;
U.S. Cl.
CPC ...
G06K 9/36 ;
Abstract

A method and apparatus is provided for analyzing and processing images by identification of characteristic lines and corresponding parameters. More particularly, the method and apparatus transforms an image into mathematical models derived from the characteristic lines and parameters, based on repetitive image patterns. The parameters include central lines, signatures, cross-sections, characteristic strips, margins, end areas, fitting transformations and fitting sequences. Each of the parameters associated with the identified characteristic lines are representable by mathematical models, which accurately approximate the geometric and brightness (or color) attributes of the respective characteristic lines.


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