The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2004
Filed:
Mar. 20, 2001
Applicant:
Inventors:
Fang Frank Chen, Rochster Hills, MI (US);
James Stewart Rankin, II, Novi, MI (US);
Mumin Song, Ann Arbor, MI (US);
Paul Joseph Stewart, Ann Arbor, MI (US);
Assignee:
Ford Global Technologies, LLC, Dearborn, MI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract
A measurement system ( ) for accurately measuring the surface geometry of a part ( ) in three dimensions includes a laser ( ) for emitting a laser beam ( ). The laser beam ( ) is transmitted to a birefringent crystal ( ) which splits the laser beam ( ) into a pair of beams ( ). The pair of beams ( ) are then subjected to a phase shift by a liquid crystal system ( ) as controlled by a computer ( ). The pair of beams ( ) are then expanded in order to form a fringe pattern ( ) on the surface of the part ( ) to be measured.