The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2004
Filed:
Jul. 31, 2001
Applicant:
Inventors:
William Alfred Reed, Summit, NJ (US);
Mark J Schnitzer, Summit, NJ (US);
Assignee:
Lucent Technologies Inc., Murray Hill, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ; G02B 6/32 ;
U.S. Cl.
CPC ...
G01B 9/02 ; G02B 6/32 ;
Abstract
An optical system for monitoring or imaging a sample includes a probe, an optical splitter or circulator, and an optical detector. The probe includes an optical fiber and a GRIN fiber-size lens fused to one end of the fiber. The optical splitter or circulator receives light from a source and directs a portion of the received light to the fiber. The optical detector is coupled to receive a portion of light collected from the sample by the GRIN fiber-size lens and is configured determine a characteristic of the sample from the received light.