The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2004

Filed:

Oct. 16, 2001
Applicant:
Inventors:

Syoichi Aoki, Tokyo, JP;

Tetsuo Yano, Tokyo, JP;

Kenji Senda, Tokyo, JP;

Kazumasa Takada, Tokyo, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/155 ; G01B 9/02 ; H04B 1/004 ; H04B 1/012 ;
U.S. Cl.
CPC ...
G01N 2/155 ; G01B 9/02 ; H04B 1/004 ; H04B 1/012 ;
Abstract

A low coherent reflectometer uses low coherent beams for measurement of refletance and refleting positions with respect to a measured optical circuit which includes a reflecting point. The low coherent beams are branched to produce measurement beams (DL) and local beams (KL), so that the measurement beams are introduced into a first optical path, which includes a dispersion shifted fiber, towards the measured optical circuit, while the local beams are introduced into a second optical path which includes a spatial optical path terminated by a reflecting mirror. Refleted measurement beams (RL) and reflected local beams are combined together to produce combined beams, which are subjected to processing and analysis.


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