The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2004
Filed:
Jan. 18, 2002
Applicant:
Inventors:
Yoshitada Oshida, Chigasaki, JP;
Satoshi Takahashi, Hitachinaka, JP;
Taisaku Seino, Tsuchiura, JP;
Kenji Yasuda, Tokyo, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/164 ;
U.S. Cl.
CPC ...
G01N 2/164 ;
Abstract
A DNA sample added with a plurality of fluorescent marks is irradiated with excitation lights having a plurality of wavelengths and when fluorescence intensities are detected separately, the excitation light and a position on the sample are relatively changed over a desired area once to thereby detect the plurality of fluorescent marks at high speed.
Oshida, Yoshitada. (2004). Method and apparatus for inspecting dna and method for detecting fluorescence (U.S. Patent No. 6760105). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6760105
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile