The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2004
Filed:
Dec. 06, 2002
Jens Harmstorf, Bobingen, DE;
Arteva Technologies, S.a.r.l., Zurich, CH;
Abstract
To detect yarn defects such as protruding filaments, broken filaments, ringers, fuzzballs, stripbacks and the like, a yarn sheet traveling in a plane is scanned by light beams from at least two light barriers . When a yarn defect interrupts the light beam of a light barrier, a detector pulse is triggered, appropriately amplified and transformed and sent to evaluating means . Such a detector pulse is triggered each time a yarn defect passes through a light barrier, so that the travel time or time difference T between the trip times of a yarn defect through the two light barriers can be determined by the evaluating means. Since the yarn sheet passes through the light barriers at a constant velocity v, the travel times for the various individual ends from one light barrier to the next will differ and therefore can be used to determine the distance S normal to the yarn traveling direction of the yarn defect to the point of intersection of the light beams of the two light barriers. When one of the light beams is oriented perpendicularly to the yarn traveling direction, the equation S=T *v/tan cc applies. The light barriers , which each comprise a light source and a detector, are arranged relative to each other in a V-shape and their light beams form the angle &agr;.