The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2004
Filed:
Jun. 03, 2003
Applicant:
Inventors:
Robert L. Thomas, Huntington Woods, MI (US);
Lawrence D. Favro, Huntington Woods, MI (US);
Xiaoyan Han, Plymouth, MI (US);
Zhong Ouyang, Glastonbury, CT (US);
Hua Sui, Windsor, CA;
Gang Sun, Fremont, CA (US);
Assignee:
Wayne State University, Detroit, MI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/904 ;
U.S. Cl.
CPC ...
G01N 2/904 ;
Abstract
A thermal imaging system for detecting cracks and defects in a structure. An ultrasonic transducer is coupled to the structure through a malleable coupler. Ultrasonic energy from the transducer causes the defects to heat up, which is detected by a thermal camera. A control unit is employed to provide timing and control for the operation of the ultrasonic transducer and the camera.