The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2004
Filed:
Jan. 09, 2002
Applicant:
Inventor:
Juergen Pensel, Altstätten, CH;
Assignee:
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/13 ; A61B 3/16 ;
U.S. Cl.
CPC ...
A61B 3/13 ; A61B 3/16 ;
Abstract
The invention concerns a combination of a microscope with a measurement device, in particular a diagnostic device, that is usable during an operation on or examination of a specimen performed with the microscope. During the operation or examination, specimen data that are ascertained or determined by the measurement device are directly displayable in the microscope as an optical signal. In the event the measured data of the specimen exceed or fall below threshold values and/or interval values, a warning signal is triggerable by way of which further actions, such as shutdown or switchover actions, can be automatically executed as applicable.