The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2004

Filed:

Apr. 14, 2000
Applicant:
Inventors:

Matthew Kaplan, New York, NY (US);

Vincent Joseph Kruskal, Harrison, NY (US);

Harold Leon Ossher, South Salem, NY (US);

Peri Lynn Tarr, Chappaqua, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 ;
U.S. Cl.
CPC ...
G06F 9/44 ;
Abstract

There is provided a method for generating a software module based upon elements from multiple software modules. The method includes the step of extracting a plurality of sets of elements from the multiple software modules based upon at least one extraction criterion. Any elements in the sets that violate at least one correctness and completeness criterion are identified. The violating elements are automatically brought into compliance with the at least one correctness and completeness criterion. A plurality of single software modules is generated, wherein each of the single software modules contains one of the sets of elements. The plurality of single software modules are composed to form a final, single software module. The extracting step may include the steps of: classifying the elements in the multiple software modules according to concerns the elements pertain to; representing the concerns by a multi-dimensional space, wherein each dimension represents a type of concern, each coordinate on a dimension represents a concern of that type, and each point in the space represents an element; and representing the at least one extraction criterion in terms of the multi-dimensional space.


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