The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2004

Filed:

Jun. 29, 2001
Applicant:
Inventor:

Robert W. Bassett, Essex Junction, VT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract

The present invention provides a systematic means of switching contiguous segments of each production-test shift-register into several diagnostic scan-configurations. If the functional scan-verification tests fail for the production-test scan-configuration, then these same verification tests can be repeated for the alternative, diagnostic scan configurations. Using the principle of superposition, the passing and failing LSSD flush/scan tests for these diagnostic configurations will allow the failing location to be localized to a single segment of the original failing shift-register.


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