The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2004
Filed:
Jul. 08, 2002
David L. Talent, Houston, TX (US);
Ken C. K. Cheung, Kailua, HI (US);
Daron L. Nishimoto, Kula, HI (US);
Oceanit Laboratories, Inc., Honolulu, HI (US);
Abstract
An orbital debris impact risk assessment and management model is provided for low-Earth orbit (LEO). The model is phenomenologically based, meaning real, theoretical and historical data of the LEO environment is used in conjunction with thermodynamic based code architecture to perform impact risk assessments. The format of the model is developed such that user friendliness and user adaptability are maximized. The model can be used as a stand-alone program (software) or run over the World-Wide Web as an application service provider (ASP). The model may be used to examine trends in the evolution of the LEO environment or to calculate likelihood of impacts for specific on-orbit assets or groups of assets.