The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2004

Filed:

May. 15, 2003
Applicant:
Inventors:

Peter Varnai, Houston, TX (US);

Stefan Hussenoeder, Sugar Land, TX (US);

Brian P. West, Houston, TX (US);

John E. Eastwood, Bellaire, TX (US);

Spyridon K. Lazaratos, Spring, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/36 ; G06F 1/900 ;
U.S. Cl.
CPC ...
G01V 1/36 ; G06F 1/900 ;
Abstract

A method for assessing the suitability of seismic data for quantitative amplitude analysis, where the concern is excessive residual normal moveout (RNMO). The invention uses a near offset stack and a far offset stack, the time difference between the two, a mute pattern, a reflection shape assumption for the RNMO, and a waveform and frequency for the far stack traces to generate a formula that estimates far stack amplitude error caused by RNMO. The formula can be used to compensate the far stack amplitude where the error is not so great as to require reprocessing of the data. The method can also be applied to interpreted amplitude maps.


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