The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2004
Filed:
Mar. 05, 2001
Dennis Lee Bowles, Fullerton, CA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
A system and a method for measuring a thickness of a workpiece. The workpiece has first and second sides, wherein the first side defines a first angular orientation. A first laser triangulation emitter/sensor may utilize an engaged first adjuster base to emit a first laser beam in generally perpendicular relation to the first angular orientation of the first side. The first laser triangulation emitter/sensor may receive a first array of diffused laser beams reflecting from the first side. There may further exist a second laser triangulation emitter/sensor sized and configured to emit a second laser beam at the second side of the workpiece. The second laser triangulation emitter/sensor may receive a second array of diffused laser beams reflecting from the second side. The first and second array of diffused laser beams may be respectively convertible into first and second signals for calculating the thickness of the workpiece.