The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2004
Filed:
Jan. 24, 2003
Kevin Davis, Ann Arbor, MI (US);
Joseph B. Slater, Dexter, MI (US);
Kaiser Optical Systems, Ann Arbor, MI (US);
Abstract
Disclosed is a method of positioning a focused image within a sampled medium in an optical measurement probe of the type wherein a focused sampling image is transmitted through a window having a surface facing a sampled medium. A test medium is measured, preferably through the window, and the magnitude of an optical signal associated with the test medium is then compared to the magnitude of an optical signal associated with the window, and the result of the comparison is used to position the focused image. Typically, the magnitudes of optical signals are representative or Raman scattering or another wavelength-selective radiative sampling process such as fluorescence detection. The method is not limited in terms of window composition, and is compatible with sapphire windows commonly used in industry. Nor is the invention limited in terms of test medium though, in the preferred embodiment a fluid hydrocarbon such as isopropyl alcohol is used.