The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2004
Filed:
May. 10, 2002
Applicant:
Inventors:
Hiroyuki Tadano, Kitakatsuragi-gun, JP;
Ikuo Nakano, Yamatokoriyama, JP;
Assignee:
Sharp Kabushiki Kaisha, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/764 ;
U.S. Cl.
CPC ...
G02B 2/764 ;
Abstract
An aberration detecting method of the present invention is arranged such that a light beam, having passed through an optical convergence system provided in an optical pickup device, illuminates a flat section of an optical disk, and using the light beam which has been reflected, and the aberration occurring in the two-element objective lens is detected.