The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2004

Filed:

May. 15, 2001
Applicant:
Inventor:

Koichi Sugimoto, Ota, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09B 3/00 ; G09B 7/00 ;
U.S. Cl.
CPC ...
G09B 3/00 ; G09B 7/00 ;
Abstract

A method to perform an adaptive test performs a pressure sensitivity test to examine a pressure sensitivity of a solver to time, and judges, based on a result of the pressure sensitivity test, whether or not the pressure sensitivity of the solver is equal to or higher than a predetermined threshold. If the pressure sensitivity is equal to or higher than the predetermined threshold, the solver is prompted to answer a pending question, acquires an input of the answer, and determines if a time period consumed by the solver in answering the pending question is shorter than a time limit set for answering the pending question and, if shorter, gives the solver an increased time limit for answering a next question.


Find Patent Forward Citations

Sugimoto, Koichi. (2004). Method and system for performing adaptive test (U.S. Patent No. 6755661). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6755661

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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