The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2004

Filed:

Mar. 28, 2002
Applicant:
Inventors:

Jorge Castano, Barcelona, ES;

David Toussaint, Barcelona, ES;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/9393 ; B41J 7/18 ;
U.S. Cl.
CPC ...
B41J 2/9393 ; B41J 7/18 ;
Abstract

A method of determining a registration offset in a hard copy apparatus, the apparatus comprising a pen arranged to mark a print medium and a sensor arranged to detect marks on the medium along a sensor path, the method comprising the steps of: marking a alignment pattern on the medium, the pattern being at least partially located along the sensor path; detecting the position along the sensor path of a portion of the pattern; and, determining a distance by which the pattern is offset from the sensor path in a direction substantially perpendicular to the sensor path, the pattern being configured such that the detected position is indicative of the offset distance.


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