The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2004
Filed:
Nov. 21, 2001
Other;
Abstract
An ultra micro indentation testing apparatus comprises: a lever stand provided with a center lever having a silicon probe and a diamond indenter disposed therein; a moving mechanism for moving the lever stand in a triaxial direction; in indentation mechanism for pushing the diamond indenter in a sample; a displacement gage for measuring a displacement of the silicon probe or the diamond indenter; and an optical picture device for positioning the silicon probe or the diamond indenter and observing the surface of the sample. The apparatus has, in combination, a hardness measuring function based on the measurement of the force and depth of the diamond indenter pushed in the surface of the sample, an atomic force microscopic function of acquiring the shape of the surface of the sample based on a displacement of the diamond indenter or the silicon probe, and an optical microscopic function of observing the surface of the sample by the optical picture device. Furthermore, the testing apparatus is equipped with both the function of measuring the hardness of the surface of material in a ultra micro region and the surface observing function with high accuracy.