The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2004
Filed:
Nov. 27, 2001
Applicant:
Inventor:
Shinsuke Takahashi, Odawara, JP;
Assignee:
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/20 ;
U.S. Cl.
CPC ...
G01B 5/20 ;
Abstract
The peripheral surface shape measuring apparatus can simply and accurately measure a peripheral surface shape of a roll-like object. The peripheral surface shape of a roll-like object is measured by moving a displacement amount measuring device which pinches a diameter direction of the roll-like object with a sensor part and a reference point part arranged opposite to each other in the diameter direction of the roll-like object, from one end side to the other end side in an axial direction of the roll-like object by using a moving device.