The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2004
Filed:
Dec. 07, 2000
Rodney A. DeKoning, Augusta, KS (US);
Charles D. Binford, Wichita, KS (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
An array controller of a data storage system initiates a test of another array controller of the data storage system to determine the operational condition of the controller under test (CUT) as well as an array of storage devices to which the CUT is connected and a network fabric over which the CUT receives commands from host devices of the data storage system. If the CUT or devices connected thereto are not functioning properly, the controller initiating the test can diagnose the problem. The controller initiating the test instructs the CUT to perform certain normal operating functions, e.g. data read and write functions, and checks whether the functions are completed correctly. Additionally, a loopback test checks the operation of the network fabric, and the read and write functions also check the operation of the storage devices.