The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2004
Filed:
Apr. 15, 2003
James D. Pate, Derby, KS (US);
Justin B. Mortensen, Wichita, KS (US);
Steven G. Hagerott, Wichita, KS (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
The present invention is directed to a method and system for automating data storage array components testing. A serial number of a data storage array component (i.e., product) is used to determine if the product is of high priority (rank) in comparison with other products in a queue and there is any test cell available for testing the product. Next, if a test is required, the product type and test requirements of the product are retrieved from a database based on the serial number, and the product is routed to the test cell from an assembly line. Then the product and a storage component interface module of the test cell are positioned so that the product and the storage component interface module face each other. The storage component interface module is chosen based on the test requirements retrieved from the database. Next the product is docked into the storage component interface so that the product is connected to the storage component interface module. Then the test is run to completion. The product is then routed down the assembly line to packaging and the customer.