The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2004
Filed:
Feb. 18, 2003
Jeffrey A. Fessler, Ann Arbor, MI (US);
The Regents of the University of Michigan, Ann Arbor, MI (US);
Abstract
A method for statistically reconstructing images from a plurality of transmission measurements having energy diversity and image reconstructor apparatus utilizing the method are provided. A statistical (maximum-likelihood) method for dual-energy X-ray CT accommodates a wide variety of potential system configurations and measurement noise models. Regularized methods (such as penalized-likelihood or Bayesian estimations) are straightforward extensions. One version of the algorithm monotonically decreases the negative log-likelihood cost function each iteration. An ordered-subsets variation of the algorithm provides a fast and practical version. The method and apparatus provide material characterization and quantitatively accurate CT values in a variety of applications. The method and apparatus provide improved noise/dose properties.