The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2004
Filed:
Jul. 02, 2001
Ricoh Company, Ltd., Tokyo, JP;
Abstract
In an optical pickup method and device of the present invention, a grating unit separates a light beam, emitted by a light source, into a 0th order diffracted beam and 1st order diffracted beams. An objective lens focuses the diffracted beams, sent from the grating unit, onto a recording surface of an optical recording medium through a transparent substrate of the medium, so that a main spot is formed on the recording surface by the 0th order diffracted beam and sub-spots, interposing the main spot therebetween, are formed on the recording surface by the 1st order diffracted beams. A reflection beam detector receives reflection beams from the main spot and the sub-spots of the medium to generate detection signals from the received reflection beams. A control unit changes a pattern of the beams incident to the objective lens to correct a spherical aberration due to a deviation of a thickness of the substrate of the medium, and moves the grating unit relative to the light source to cancel shifting of sub-spot positions on the recording surface due to the spherical aberration correction, in order to generate a proper tracking error signal.