The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2004
Filed:
Sep. 24, 2002
David Suitwai Ma, Cary, NC (US);
Paul Edward Brucke, Durham, NC (US);
Infineon Technologies AG, Munich, DE;
Abstract
A data topography correction circuit for a semiconductor memory device and method for testing the device is provided. The data topography correction circuit includes a redundant hit circuit for determining if a redundant element has been used to replace a defective element; and a redundant topology correction scrambler circuit for converting data from a data topology of the defective element to a data topology of the redundant element. The method includes the steps of providing an address of a memory array element of the device to be tested; determining if the memory array element has been replaced with a redundant element; and, if the memory array element has been replaced, correcting test data to the data topology of the redundant element.