The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2004
Filed:
Sep. 07, 2000
Applicant:
Inventor:
Robert Evan Myer, Denville, NJ (US);
Assignee:
Lucent Technologies Inc., Murray Hill, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/726 ;
U.S. Cl.
CPC ...
G01R 2/726 ;
Abstract
An inexpensive RF test probe provides consistent monitoring of an RF signal while having minimal effect on the circuit under test. In one embodiment, an RF test probe comprises a return conductor and a probing conductor. The probing conductor is positioned within an insulator and a termination such as a 50 ohm resistor is electrically positioned between the ground conductor and probing conductor. The probe is used by placing a portion of the insulating material surrounding the probe conductor in contact with a circuit such as an RF microstrip carrying an RF signal to be monitored.