The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6753240 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 22, 2004

Filed:

May. 21, 2002
Applicant:
Inventor:

Yukinobu Hayashida, Tateyama, JP;

Assignee:

UMC Japan, Chiba-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1425 ;
U.S. Cl.
CPC ...
H01L 2/1425 ;
Abstract

The present invention provides a semiconductor device production method that eliminates the risk of the occurrence of residual resist in the production process, and as a result, allows the electrical characteristics and reliability of the device to be improved. In this semiconductor device production method comprising steps of: subsequently laminating a first resist layer and a second resist layer having desired patterns on a semiconductor substrate, forming a first conductive region on the semiconductor substrate by injecting a first ion into the semiconductor substrate using the first and second resist layers as masks, removing the second resist layer, forming a second conductive region on the semiconductor substrate by injecting a second ion into the semiconductor substrate using the remaining first resist layer as a mask, and removing the first resist layer.


Find Patent Forward Citations

Hayashida, Yukinobu. (2004). Semiconductor device production method (U.S. Patent No. 6753240). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6753240

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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