The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2004
Filed:
Nov. 02, 2001
Xavier Jean-Francois Levecq, Gif sur Yvette, FR;
Samuel Henri Bucourt, Bures sur Yvette, FR;
Imagine Optic, Orsay, FR;
Abstract
A device for the analysis of an optical wavefront includes an array (ML) of microlenses (L ), and signal processing elements. Each mircolens (L ) defines a subaperature (Sp ), and focuses an elementary surface of the wavefront, intercepted by the subaperature, for forming a spot (T ) on the detector. For each subaperature (Sp ), a zone (Z ) of assumed localization of the spot is defined. The processing unit makes it possible to establish a measurement file associating to each subaperature the position of this spot. The structure of the array (ML) presents one or several local variations. By comparing the contribution of these local variations taken from the measurement file, with their contribution taken from a reference file, the displacement between the subaperature from which a detected spot is derived and the subaperature that defines the zone of assumed localization wherein the spot is located is measured.