The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2004

Filed:

Mar. 22, 2002
Applicant:
Inventors:

Yasushi Satoh, Kanagawa, JP;

Yoshihiro Kumagai, Kanagawa, JP;

Takehiro Toyooka, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/13 ;
U.S. Cl.
CPC ...
G02F 1/13 ;
Abstract

A complex diffraction device, which is excellent in designability, easy in setting the diffraction angle, adaptable to size increase, and easy to handle by adding a diffraction function resulting from an uneven pattern to the diffraction device comprising a liquid crystalline layer where the helical orientation of the smectic liquid crystal phase having a helical structure is maintained.


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