The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2004
Filed:
Nov. 04, 2002
Hirokazu Miyazaki, Tokyo, JP;
Oki Electric Industry Co., Ltd., Tokyo, JP;
Abstract
A novel measurement method is provided capable of measuring characteristics of semiconductor integrated circuit devices without incurring the influence of external measuring means. A prescribed delay time applied to an address supplied from a microprocessor to a memory during normal operation is increased and a critical time where data corresponding to the address can no longer be read in by the microprocessor from the memory via the latch circuit correctly is obtained. The delay time with which the address is supplied to the latch circuit is increased with the address being supplied in a short-circuited manner to the latch circuit rather than being supplied to the memory and a short-circuit critical delay time where the address can no longer be read in correctly is obtained. A time difference corresponding to a difference in critical delay times is then obtained as the memory access time of the semiconductor integrated circuit device