The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2004
Filed:
Nov. 25, 2002
Arnim Franz-Burgholz, Falkensee, DE;
Roland Gutmann, Falkensee, DE;
Harald Hoeppner, Berlin, DE;
Thomas Löer, Berlin, DE;
Detlef Märtens, Berlin, DE;
Günther Dausmann, Erding, DE;
Zishao Yang, Erding, DE;
Robert Massen, Öhningen, DE;
Thomas Franz, Konstanz, DE;
Thomas Leitner, Konstanz, DE;
Jörg Eberhardt, Tettnang, DE;
Bundesdruckerei GmbH, Berlin, DE;
Abstract
An apparatus for evaluating distinguishing authenticity features comprising diffraction elements on a document which is illuminated by an illumination source. The distinguishing authenticity element which is to be examined, diffracts the beam of the illuminating source and projects it onto an evaluating unit in the device. In order to be independent of the nature and location of the diffraction pattern, the diffraction pattern derived from the document to be examined is projected onto a screen and the image of the pattern recorded and evaluated by a camera (matrix or cells).