The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2004
Filed:
Nov. 06, 2001
Christopher J. Percival, Williamsville, NY (US);
Douglas H. Hoover, Corfu, NY (US);
Reichert, Inc., Depew, NY (US);
Abstract
A fast position detection system and related method for an ophthalmic instrument utilize stored geometrical relationships determined by multiple regression during instrument calibration to compute X-Y-Z alignment status of the instrument relative to a patient's eye based on local x-y position information from a pair of lateral detectors receiving corneally reflected light from a corresponding pair of lateral light sources. In a preferred embodiment, the lateral detectors are quad-cell detectors. A heads-up display image is preferably provided along an optical axis of the instrument for supplying instructive cues to an operator for moving the instrument to achieve alignment, whereby the operator sees both a macro-image of the patient's eye and the display image. The speed of the position detection system makes it particularly suitable for use in hand-held ophthalmic instruments.