The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2004
Filed:
Jun. 26, 2000
Applicant:
Inventors:
Harald Geiger, Neuried, DE;
Christoph Glingener, Feldkirchen-Westerham, DE;
Erich Gottwald, Holzkirchen, DE;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 1/008 ;
U.S. Cl.
CPC ...
H04B 1/008 ;
Abstract
A method for measuring the signal quality of an optical data signal is provided. To measure the signal quality, and in particular the signal-to-noise ratio of an optical data signal which has data-free time intervals, the signal strength of the transmitted optical data signal is measured during a data transmission. The signal strength of the noise signal is determined during the data-free time intervals. The signal-to-noise ratio is determined and used as a criterion for the signal quality of the optical data signal.