The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2004
Filed:
Jun. 04, 2003
Timothy E. Ostromek, Richardson, TX (US);
Timothy B. Hogan, Irving, TX (US);
Jeffrey C. Short, Plano, TX (US);
Antonio V. Bacarella, Dallas, TX (US);
Jerry D. Porter, Dallas, TX (US);
Allan B. Lewis, Nevada, TX (US);
Rodney L. Doster, Garland, TX (US);
Robert F. Lund, Plano, TX (US);
Litton Systems, Inc., Los Angeles, CA (US);
Abstract
A system (S) for mounting and aligning a detector (D) about an observation instrument ( ) includes a first detector ( ) movably coupled to the observation instrument ( ) off an axis of observation centerline ( ) for the observation instrument ( ). A retainer ( ) is mounted with the observation instrument ( ) to secure the first detector ( ) to the observation instrument ( ). The retainer ( ) permits rotatable movement of the first detector ( ) about the axis of observation centerline ( ). The retainer ( ) also preferably includes an attachment point ( ) for mounting the first detector ( ) to the retainer ( ). The first detector ( ) should be adjustable at least about an axis ( ) essentially perpendicular to the axis of the observation centerline ( ) for the observation instrument ( ).