The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2004

Filed:

Dec. 05, 2001
Applicant:
Inventors:

Jack R. Kelly, Stow, OH (US);

Haiji J. Yuan, Cupertino, CA (US);

Qingyu (Tom) Li, Cupertino, CA (US);

Hudson Washburn, Santa Clara, CA (US);

Assignee:

CoAdna Photonics, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/01 ; G02F 1/03 ; G02B 6/00 ;
U.S. Cl.
CPC ...
G02F 1/01 ; G02F 1/03 ; G02B 6/00 ;
Abstract

The invention includes an apparatus for processing an input optical beam. The apparatus has at least one variable optical element to dynamically alter the polarization state of an optical beam to form a polarization-altered optical beam, wherein the polarization-altered optical beam includes elliptical polarization. At least one wave plate operates on the polarization-altered optical beam, each wave plate has a selected retardation, order of retardation, and orientation. A polarization analyzer, operating in conjunction with the at least one variable optical element and wave plate, alters the transmitted amplitude of the polarization-altered optical beam as a function of wavelength, and thereby produces an output optical beam with transmitted amplitude adjusted as a function of wavelength.


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