The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2004

Filed:

Oct. 31, 2000
Applicant:
Inventors:

Michael J. Leveille, Northbridge, MA (US);

Joseph M. DeLuca, Mendon, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/105 ;
U.S. Cl.
CPC ...
G01N 2/105 ;
Abstract

A photometric measurement flow cell having measurement path-lengths that can be adjusted down to less than 0.1 mm. The measurement path-length is controlled by both a common flow cell body and the dimensional parameters of a stepped sealing optical element. The stepped optical element includes a stem portion that can be made in various lengths to create a family flow cell measurement path-lengths. The replacement of one stepped element with another having a different stem length within the flow cell creates a reliable method to adjust the measured path-length of the flow cell.


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