The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2004

Filed:

Sep. 19, 2002
Applicant:
Inventors:

Giuseppe Queirolo, Milan, IT;

Giovanni Ferroni, Milan, IT;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/120 ; H01L 2/136 ;
U.S. Cl.
CPC ...
H01L 2/120 ; H01L 2/136 ;
Abstract

The electrical performance of a dielectric film for capacitive coupling in an integrated structure is enhanced by forming the polycrystalline electrically conductive layer coupled with the dielectric film substantially unigranular over the coupling area, commonly to be defined by patterning the stacked dielectric and conductive layers. The process forms a polycrystalline silicon film having exceptionally large grains of a size on the same order of magnitude as the dimensions of the patterned details. These exceptionally large grains are obtained by preventing the formation of “precursor nuclei” of subsequent grain formation and growth at the deposition interface with the dielectric that are apparently formed during the first instants of silicon CVD deposition and by successively growing the crystallites at a sufficiently low annealing temperature.


Find Patent Forward Citations

Loading…