The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2004
Filed:
Jun. 14, 2001
Dae-Suk Chung, Austin, TX (US);
Gregory P. Davis, Raleigh, NC (US);
David B. Kumhyr, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, computer program product and system for estimating the number of internationalization faults, e.g., errors, warnings, in a software program. The number of internationalization faults may be estimated by scanning a subset of the total lines of code in a software program. A first factor may be calculated based on a count and the number of faults identified in the lines of code scanned. A second factor may be calculated based on the number of faults remaining after subtracting the number of faults identified in error from the number of faults identified in the lines of code scanned as well as the number of faults identified in the lines of code scanned. An estimate of the number of faults in the entire software program may be calculated based on the first and second factor and the count of the total number of lines of code in the software program.