The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2004

Filed:

Aug. 16, 2002
Applicant:
Inventor:

Tetsuya Horiuchi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 ;
U.S. Cl.
CPC ...
A61B 6/03 ;
Abstract

In order to obtain an image with artifacts suppressed when a helical scan is conducted employing a multi-row detector with a scan plane tilted, preprocessing such as sensitivity correction is applied to data collected by a helical scan employing a multi-row detector with a scan plane tilted (S ), tilt correcting processing is applied for correcting view-to-view variation of the positions of channels in the detector rows relative to an axis of translation due to the tilt of the scan plane (S ), multi-slice/helical interpolation processing is applied for calculating interpolated data from proximate data in an image reconstruction plane (S ), and backprojection processing is applied to the interpolated data to produce an image (S ).


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