The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2004

Filed:

Oct. 24, 2001
Applicant:
Inventors:

Roger L. Jungerman, Petaluma, CA (US);

Randall King, Santa Rosa, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/728 ; G01J 4/00 ;
U.S. Cl.
CPC ...
G02B 2/728 ; G01J 4/00 ;
Abstract

A method and apparatus for sampling optical input signal is presented. The apparatus includes a split waveplate for spatially rotating polarization direction of a first portion (for example half, or 50 percent) of the input signal to a first rotated direction and spatially rotating polarization direction of a second portion (for example the other 50 percent) of the input signal to a second rotated direction orthogonal to the first rotated direction. The apparatus further includes a sum frequency generator, for example a PPLN crystal, aligned to the first rotated direction to sample the input signal. The rotation of the two halves of the input signal is achieved using a split half-waveplate.


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