The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2004

Filed:

Jan. 07, 2003
Applicant:
Inventors:

Timothy A. Skunes, Mahtomedi, MN (US);

Eric P. Rudd, Hopkins, MN (US);

David W. Duquette, Minneapolis, MN (US);

Assignee:

CyberOptics Corporation, Golden Valley, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/10 ;
U.S. Cl.
CPC ...
G01J 1/10 ;
Abstract

A method of calibrating a pick and place machine having an on-head linescan sensor is disclosed. The calibration includes obtaining z-axis height information of one or more nozzle tips via focus metric methods, including a Fourier transform method and a normalized correlation method. Additionally, other physical characteristics such as linear detector tilt, horizontal scale factor, and vertical scale factor are measured and compensated for in the process of placing the component. Nozzle runout, another physical characteristic, is also measured by a sinusoidal curve fit method, and the resulting Z-height calibration data is used to later place the component.


Find Patent Forward Citations

Loading…