The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2004
Filed:
Jul. 09, 2003
Michael L. Whitehead, Scottsdale, AZ (US);
Steven R. Miller, Cave Creek, AZ (US);
CSI Wireless Inc., Alberta, CA;
Abstract
A method of measuring phase of a pseudorandom (PN) sequence of chips, the method includes: generating a reference model exhibiting a reference phase, the reference phase adjustable to facilitate alignment with the phase of the pseudorandom sequence; establishing a plurality of pulsed-windows over which a plurality of samples of the pseudorandom sequence are collected for a selected accumulation interval; and accumulating the plurality of samples for each pulsed-window of the plurality of pulsed windows to form a plurality of accumulated sums. The method also includes: compensating each accumulated sum to form at least one compensated sum, if a number of level transitions and non-transitions of the pseudorandom sequence is not equal; and combining the compensated sum to determine a phase error from the plurality of compensated sums, the phase error corresponding to a phase difference between the reference phase and the phase of the pseudorandom sequence.