The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2004

Filed:

May. 30, 2002
Applicant:
Inventors:

Yoshikazu Taniguchi, Yokkaichi, JP;

Setsurou Mori, Ritto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01H 3/102 ; G01R 3/100 ;
U.S. Cl.
CPC ...
H01H 3/102 ; G01R 3/100 ;
Abstract

A method and apparatus are provided to quickly electrically test an electrical wiring system that has a large number of contacts by maximally reducing the number of electrical tests. A plurality of contacts forming a network of an electrical wiring system is divided into a plurality of groups. The respective groups are insulated from each other. The insulated states of these groups are discriminated, and the insulated states of the respective contacts in the respective groups are discriminated if the insulated states of the respective groups are judged to be satisfactory.


Find Patent Forward Citations

Taniguchi, Yoshikazu. (2004). Apparatus, a method for testing an electrical wiring system, a computer program for testing an electrical wiring system and a computer-readable storage medium having stored thereon a computer program for testing an electrical wiring system (U.S. Patent No. 6744257). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6744257

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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