The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2004
Filed:
Oct. 29, 2001
Applicant:
Inventors:
Kenneth Paul Parker, Fort Collins, CO (US);
Myunghee Lee, San Jose, CA (US);
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01H 3/102 ; G01R 3/108 ; G01R 3/102 ; G01R 3/126 ;
U.S. Cl.
CPC ...
H01H 3/102 ; G01R 3/108 ; G01R 3/102 ; G01R 3/126 ;
Abstract
Disclosed are methods and apparatus for testing opto-electronic devices. Test data is shifted into a first boundary-scan cell. A test is then launched from the first boundary-scan cell by outputting the shifted test data to a signal generator. The signal generator, in turn, provides conditioned test data to an opto-electronic transmitter, in response to the shifted test data and at least one constraint for operating the opto-electronic transmitter. Finally, a response to the test is captured.