The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2004
Filed:
Apr. 27, 2001
Heinz Hornung, Gilching, DE;
Achim Philipp, Kolbemoor, DE;
Giesecke & Devrient GmbH, , DE;
Abstract
A method and apparatus for testing a paper of value, in particular for condition testing of a bank note, are proposed wherein the bank note is subjected both to dark-field measurement and to bright-field measurement. From comparison of the measuring results of dark-field measurement and bright-field measurement one can make a clear statement about whether a flaw, for example a hole, tear, etc., is present in the bank note in the tested area. The bright-field and dark-field measuring devices can be formed separately with one LED array and detector array in each case. However, preferred embodiments provide for either a common LED array with two detectors or two LED arrays with a common detector. If two LED arrays are used, the dark-field radiation source is preferably formed as an IR light source and the bright-field radiation source as a red-light radiation source in order to permit authenticity testing of the paper of value to be performed as well as condition testing thereof. (FIG. )