The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2004

Filed:

Sep. 10, 2001
Applicant:
Inventors:

Hiroshi Yoshikawa, Tokyo, JP;

Naohiro Kamijo, Tokyo, JP;

Teruki Kamada, Tokyo, JP;

Masato Takada, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/14 ; H04N 1/04 ; B41J 2/47 ;
U.S. Cl.
CPC ...
H01J 3/14 ; H04N 1/04 ; B41J 2/47 ;
Abstract

A scan beam light quantity distribution method and apparatus using a two-dimensional area light receiving sensor ( ) movable in the same direction as scan direction of a scan beam. The two-dimensional area light receiving sensor ( ) detects a scan beam while moving in the scan direction of the scan beam. The scan beam received by the two-dimensional area light receiving sensor ( ) is correlated with position information when stored in data storage section ( .) By using scan beam data stored in the data storage section, analysis is made on a light quantity distribution of the scan beam scanned in X-direction.


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