The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2004

Filed:

Dec. 01, 2000
Applicant:
Inventor:

Makoto Miyazawa, Nagano, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 9/14 ; B24B 1/306 ; G02C 7/02 ; C08J 7/00 ;
U.S. Cl.
CPC ...
B24B 9/14 ; B24B 1/306 ; G02C 7/02 ; C08J 7/00 ;
Abstract

Production information such as an edging mark indicating a region of a lens remaining after edging and reference position marks are depicted in a region, to be cut off by the edging, of a surface of a lens for spectacles. Any production information does not remain on the finished lens after the edging. A lens processing system includes a reference position detecting apparatus ( and ) for detecting a reference position of a spectacle lens, and a marking apparatus ( and ) for depicting production information of the lens on a specific surface of the spectacle lens on the basis of the reference position information obtained by the reference position detecting apparatus ( and ).


Find Patent Forward Citations

Miyazawa, Makoto. (2004). Method for producing spectacle lens and lens processing system (U.S. Patent No. 6743486). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6743486

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…