The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2004
Filed:
Dec. 28, 2001
Christoph Hauger, Aalen, DE;
Werner Pöltinger, Oberkochen, DE;
Peter Reimer, Ellwangen, DE;
Margit Krause-Bonte, Aalen, DE;
Theo Lasser, Oberkochen, DE;
Carl-Zeiss-Stiftung, , DE;
Abstract
A method is disclosed for fixing at least one location in an examination field ( ) with respect to a coordinate system ( ). The method includes determining, in response to a request ( ), coordinates of a first location ( ) as a first coordinate set (x, y, z) allocated to the first location ( ). A first recording and a second recording of topological data ( ) in a spatially extended area around the first location ( ) in the examination field ( ) are obtained. The first and second recordings are compared to determine a displacement (&Dgr;x, &Dgr;y, &Dgr;z) of the first location ( ) of the examination field ( ) with respect to the coordinate system ( ), the coordinates of the first coordinate set (x, y, z) allocated to the first location ( ) are changed dependent upon the determined displacement (&Dgr;x, &Dgr;y, &Dgr;z) such that the changed coordinates substantially correspond to the coordinates of the first location ( ) in the examination field ( ) after the displacement thereof.