The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2004
Filed:
Apr. 05, 2001
Yoshihiro Sasaki, Tokyo, JP;
Masahiko Nagao, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
An appearance inspection method, includes (a), (b), (c), (d), (e), (f), (g), and (h). The (a) includes providing an image data in which an inspected sample is photographed. The (b) includes detecting a brightness of each of a plurality of image units included in the image data based on the image data. The (c) includes detecting the number of the image units being identical with each other in the brightness for each of the brightness. The (d) includes detecting, as a measured maximum number, the number that is maximum of the detected numbers as a result of the (c). The (e) includes computing the measured maximum number to determine a set maximum number. The (f) includes determining a threshold level of the brightness based on the set maximum number. The (g) includes converting the image data into a binary pattern based on the threshold level. The (h) includes detecting a defect of the inspected sample based on the binary pattern.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile